Advanced electron microscopy
Surface & structural analysis
Surface & structural analysis
Themis Z double aberration-corrected S/TEM for atomic-resolution imaging and elemental mapping. Helios G4 UX DualBeam SEM/FIB for cross-sectioning, slice-and-view, and TEM sample preparation. Full tomography and 3D reconstruction available.
Surface & structural analysis
Surface & structural analysis
Surface & structural analysis
Panalytical MRD X'Pert Pro high-resolution XRD for crystal structure and strain. Kratos Axis Ultra DLD XPS for surface chemical composition. Omicron surface analysis cluster with XPS, LEED, UHV STM/AFM, HREELS, and integrated UHV synthesis and deposition for full in-situ characterization without air exposure.
Electrical & magnetic characterization
Electrical & magnetic characterization
Electrical & magnetic characterization
Eight probe stations from DC to 40 GHz, 4.5 K to 900 °C, and up to 2.5 T — including cryogenic (LakeShore CRX-4K, CRX-VF), high-temperature (MicroXact CPS-50-HT), and semi-automatic 8" wafer-scale (FormFactor PAV200) configurations. Keysight B1500A and Keithley 4200A for I-V and C-V. High-current curve tracer (2 kV / 100 A). Vector netwo
Eight probe stations from DC to 40 GHz, 4.5 K to 900 °C, and up to 2.5 T — including cryogenic (LakeShore CRX-4K, CRX-VF), high-temperature (MicroXact CPS-50-HT), and semi-automatic 8" wafer-scale (FormFactor PAV200) configurations. Keysight B1500A and Keithley 4200A for I-V and C-V. High-current curve tracer (2 kV / 100 A). Vector network analyzer (10 MHz–44 GHz). Oxford Triton dilution refrigerator (10 mK, 12 T). Quantum Design DynaCool PPMS (1.8–400 K, 9 T) with VSM and broadband FMR. Quantum Design MPMS-3 SQUID magnetometer (1.8–1000 K, ±7 T, <10⁻⁸ emu sensitivity).
Optical spectroscopy
Electrical & magnetic characterization
Electrical & magnetic characterization
Spectroscopic ellipsometry (J.A. Woollam RC2, V-VASE, M-2000, and IR-VASE; 200–3000 nm and IR range) for refractive index, permittivity, and composition. Raman imaging microscopy (Thermo Scientific DXR3xi, 455/532 nm). PerkinElmer Lambda 950 UV-VIS-NIR spectrophotometer (190–3000 nm) with integrating sphere. Neaspec IR-Neascope for near-
Spectroscopic ellipsometry (J.A. Woollam RC2, V-VASE, M-2000, and IR-VASE; 200–3000 nm and IR range) for refractive index, permittivity, and composition. Raman imaging microscopy (Thermo Scientific DXR3xi, 455/532 nm). PerkinElmer Lambda 950 UV-VIS-NIR spectrophotometer (190–3000 nm) with integrating sphere. Neaspec IR-Neascope for near-field optical imaging (TERS, NSOM, TEPL) and NanoFTIR ultrafast pump-probe. Polytec laser Doppler vibrometer. Microsanj NT220 thermoreflectance imaging. Thin-film stress measurement and Kruss DSA25 drop shape analyzer.