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Electrical characterization of materials and devices is performed using tools like a Physical Property Measurement System (PPMS) and a probe station. The PPMS allows precise measurement of electrical properties—such as resistivity, Hall effect, and magnetotransport—under controlled temperatures and magnetic fields. A probe station enables
Electrical characterization of materials and devices is performed using tools like a Physical Property Measurement System (PPMS) and a probe station. The PPMS allows precise measurement of electrical properties—such as resistivity, Hall effect, and magnetotransport—under controlled temperatures and magnetic fields. A probe station enables direct contact with micro- or nanoscale devices on a chip using fine probes, allowing current-voltage (I-V) measurements, conductivity mapping, and device testing. Together, these tools provide comprehensive insights into the electronic behavior and performance of materials and fabricated devices.
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