QuantaFab Technologies
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      • Patterning
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      • Electron Microscopy
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      • Elect. characterization
    • Partners
      • Birck Nanotech Center
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      • MEMS
      • Biomedical Devices
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      • Sensors
      • III-V Devices
      • 2D materials
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  • Home
  • Services
    • Patterning
    • Deposition
    • Etching
    • Packaging
    • Electron Microscopy
    • Optical Characterization
    • Elect. characterization
  • Partners
    • Birck Nanotech Center
  • Device Types
    • MEMS
    • Biomedical Devices
    • Analog Electronic ICs
    • Sensors
    • III-V Devices
    • 2D materials
    • Quantum Devices
    • Custom Chip
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About QuantaFab Technologies

Electrical characterization of materials and devices is performed using tools like a Physical Property Measurement System (PPMS) and a probe station. The PPMS allows precise measurement of electrical properties—such as resistivity, Hall effect, and magnetotransport—under controlled temperatures and magnetic fields. A probe station enables

Electrical characterization of materials and devices is performed using tools like a Physical Property Measurement System (PPMS) and a probe station. The PPMS allows precise measurement of electrical properties—such as resistivity, Hall effect, and magnetotransport—under controlled temperatures and magnetic fields. A probe station enables direct contact with micro- or nanoscale devices on a chip using fine probes, allowing current-voltage (I-V) measurements, conductivity mapping, and device testing. Together, these tools provide comprehensive insights into the electronic behavior and performance of materials and fabricated devices.

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