Electron Microscopy

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Scanning Electron Microscopy (SEM) is a high-resolution imaging technique that uses a focused electron beam to scan a sample’s surface, producing detailed topographical and compositional images. SEM can reveal features down to the nanometer scale, making it ideal for analyzing microstructures, thin films, and materials in research and sem

Scanning Electron Microscopy (SEM) is a high-resolution imaging technique that uses a focused electron beam to scan a sample’s surface, producing detailed topographical and compositional images. SEM can reveal features down to the nanometer scale, making it ideal for analyzing microstructures, thin films, and materials in research and semiconductor fabrication. It provides depth of field and contrast far beyond optical microscopes, allowing precise inspection of surface morphology and defects.